Muzaffer Orkun Simsir received his B.S. degree in computer engineering from Bogazici University, Turkey, in 2003, and his M.A. and Ph.D degrees in electrical engineering from Princeton University in 2006 and 2010, respectively. His work on nanoelectronic circuit design, computer-aided design tools for nanotechnologies and testing of nanoelectronic circuits appeared in several peer reviewed publications. His work on "Thermal Characterization of BIST, Scan Design and Sequential Test Methodologies," was nominated for the best paper award at the International Test Conference (ITC) in 2009. While at Princeton, he was awarded Charles Ames Brooks, Class of 1905, fellowship in 2004-2005. During his graduate studies, he interned at Intel Corporation and NEC Labs America working on system content grading of test methods and reliability of nanotechnology-based circuits, respectively.
He worked at Credit Suisse, NY, for a year after his graduation. In 2011, he moved to Goldman Sachs.